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Yuille, A. L., Coughlan, J., & Zhu, S. Chun. (2000). Unified framework for performance analysis of Bayesian inference. In AeroSense 2000 (pp. 333–346). International Society for Optics and Photonics.
Yuille, A. L., & Coughlan, J.. (1997). Twenty Questions, Focus of Attention, and A*: A theoretical comparison of optimization strategies. In Energy Minimization Methods in Computer Vision and Pattern Recognition (pp. 195–212). Springer Berlin Heidelberg.
Yuille, A. L., & Coughlan, J.. (1999). Visual search: Fundamental bounds, order parameters, and phase transitions. Proc Ieee Workshop On Statistical And Computational Theories Of Vision. Cvpr 1999. Fort Collins, Co. June 1999. (Original work published 1999)
Yuille, A. L., & Coughlan, J.. (2000). Fundamental limits of Bayesian inference: order parameters and phase transitions for road tracking. Pattern Analysis And Machine Intelligence, Ieee Transactions On, 22, 160–173.
Yuille, A. L., Coughlan, J., & Konishi, S.. (2001). The KGBR viewpoint-lighting ambiguity and its resolution by generic constraints. Computer Vision, 2001. Iccv 2001. Proceedings. Eighth Ieee International Conference On, 2, 376–382.
Yuille, A. L., & Coughlan, J.. (1999). High-Level and Generic Models for Visual Search: When does high level knowledge help?. In Computer Vision and Pattern Recognition, 1999. IEEE Computer Society Conference on. (Vol. 2). IEEE.
Yuille, A. L., Coughlan, J., & Konishi, S.. (2003). The generic viewpoint assumption and planar bias. Ieee Transactions On Pattern Analysis And Machine Intelligence, 25, 775–778.
Yuille, A. L., Coughlan, J., & Konishi, S.. (2000). The generic viewpoint constraint resolves the generalized bas relief ambiguity. Proc. Of Conference On Information Scienes And Systems (Ciss 2000), 15–17.
Yuille, A. L., Coughlan, J., & Konishi, S.. (2003). The KGBR viewpoint-lighting ambiguity. Journal Of The Optical Society Of America (Josa) A, 20(1). (Original work published 2003)
Yuille, A. L., Coughlan, J., Zhu, S. Chun, & Wu, Y.. (2000). Order Parameters for Minimax Entropy Distributions: When does high level knowledge help?. In Computer Vision and Pattern Recognition, 2000. Proceedings. IEEE Conference on (Vol. 1, pp. 558–565). IEEE.