Publications

Konishi, S., Yuille, A. L., Coughlan, J., & Zhu, S. Chun. (2003). Statistical edge detection: Learning and evaluating edge cues. Pattern Analysis And Machine Intelligence, Ieee Transactions On, 25, 57–74.

Konishi, S., Yuille, A. L., Coughlan, J., & Zhu, S. Chun. (2002). Fundamental bounds on edge detection: learning and evaluating edge cues. Pattern Anal. Machine Intell.

Yuille, A. L., Coughlan, J., Wu, Y., & Zhu, S. Chun. (2001). Order Parameters for Detecting Target Curves in Images: When does high level knowledge help?. International Journal Of Computer Vision, 41, 9–33.

Yuille, A. L., Coughlan, J., Zhu, S. Chun, & Wu, Y.. (2000). Order Parameters for Minimax Entropy Distributions: When does high level knowledge help?. In Computer Vision and Pattern Recognition, 2000. Proceedings. IEEE Conference on (Vol. 1, pp. 558–565). IEEE.

Yuille, A. L., Coughlan, J., & Zhu, S. Chun. (2000). Unified framework for performance analysis of Bayesian inference. In AeroSense 2000 (pp. 333–346). International Society for Optics and Photonics.

Konishi, S., Yuille, A. L., Coughlan, J., & Zhu, S. Chun. (1999). Fundamental bounds on edge detection: An information theoretic evaluation of different edge cues. In Computer Vision and Pattern Recognition, 1999. IEEE Computer Society Conference on. (Vol. 1). IEEE.